Published in

American Institute of Physics, Journal of Applied Physics, 7(113), p. 073508

DOI: 10.1063/1.4792747

Links

Tools

Export citation

Search in Google Scholar

Oxygen diffusivity in silicon derived from dynamical X-ray diffraction

This paper is available in a repository.
This paper is available in a repository.

Full text: Download

Green circle
Preprint: archiving allowed
Green circle
Postprint: archiving allowed
Orange circle
Published version: archiving restricted
Data provided by SHERPA/RoMEO