Published in
American Institute of Physics, Journal of Applied Physics, 2(86), p. 960
DOI: 10.1063/1.370832
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Structural and electrical characterization of SrBi2Nb2O9 thin films deposited on YBa2Cu3O7−δ and Nb doped SrTiO3
Journal article published in 1999 by
C.-H. Schwan,
P. Haibach,
G. Jakob 
,
J. C. Martı́nez,
H. Adrian
,
J. C. Martı́nez,
H. Adrian
This paper was not found in any repository, but could be made available legally by the author.
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