Published in
American Institute of Physics, Applied Physics Letters, 5(100), p. 052110
DOI: 10.1063/1.3678186
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Modeling the transport properties of epitaxially grown thermoelectric oxide thin films using spectroscopic ellipsometry
Journal article published in 2012 by
S. R. Sarath Kumar,
Anas I. Abutaha 
,
M. N. Hedhili ,
H. N. Alshareef
,
M. N. Hedhili ,
H. N. Alshareef
This paper is available in a repository.
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