Published in
American Institute of Physics, Journal of Applied Physics, 6(82), p. 3120-3124, 1997
DOI: 10.1063/1.366153
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Grazing incidence reflectivity and total electron yield effects in soft x-ray absorption spectroscopy
Journal article published in 1997 by
D. Alders,
T. Hibma,
G. A. Sawatzky,
K. C. Cheung,
G. E. van Dorssen,
M. D. Roper,
H. A. Padmore,
G. van der Laan 
,
J. Vogel ,
M. Sacchi
,
J. Vogel ,
M. Sacchi
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
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