Published in
American Institute of Physics, Journal of Applied Physics, 1(110), p. 014505, 2011
DOI: 10.1063/1.3602999
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Charge trapping in alumina and its impact on the operation of metal-alumina-nitride-oxide-silicon memories: Experiments and simulations
Journal article published in 2011 by
Andrea Padovani,
Luca Larcher,
Vincenzo Della Marca,
Paolo Pavan 
,
Hokyung Park,
Gennadi Bersuker
,
Hokyung Park,
Gennadi Bersuker
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
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