Published in
American Institute of Physics, Journal of Applied Physics, 4(78), p. 2403-2410, 1995
DOI: 10.1063/1.360162
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Structural characterization of lattice matched AlxIn1−xAs/InP and GayIn1−yAs/InP heterostructures by transmission electron microscopy and high-resolution x-ray diffraction
Journal article published in 1995 by
E. Carlino 
,
C. Giannini,
L. Tapfer,
M. Catalano,
E. Tournié,
Y. H. Zhang,
K. H. Ploog
,
C. Giannini,
L. Tapfer,
M. Catalano,
E. Tournié,
Y. H. Zhang,
K. H. Ploog
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
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