Published in
American Institute of Physics, Applied Physics Letters, 19(98), p. 192113
DOI: 10.1063/1.3590920
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Direct measurement of compositional complexity-induced electronic inhomogeneity in VO2 thin films grown on gate dielectrics
Journal article published in 2011 by
Zheng Yang 
,
Shriram Ramanathan
,
Shriram Ramanathan
This paper was not found in any repository, but could be made available legally by the author.
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