Published in

American Institute of Physics, Applied Physics Letters, 12(95), p. 121902

DOI: 10.1063/1.3232218

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Stress influence on band-edge luminescence properties of 4H-AlN

Journal article published in 2009 by Yc C. Cheng, Xl L. Wu ORCID, Sh H. Li ORCID, Paul K. Chu
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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Abstract

The band-edge luminescence properties of 4H-AlN under biaxial and uniaxial stress are studied using the first-principle method. In equilibrium, excitons B and C have energies 92 and 14 meV lower than exciton A, respectively. When the uniaxial tensile strain exceeds ∼0.95%, the top valence band is the B exciton state. Its band-edge emission is no longer prohibited and changes to E⊥c. The shift in the A exciton energy is similar to that of 2H-AlN under stress of −5 to 5 GPa. When the compressive biaxial strain is larger than 5 GPa, the band structure of 4H-AlN becomes indirect.