Published in

American Institute of Physics, Journal of Applied Physics, 5(102), p. 053504

DOI: 10.1063/1.2773630

Links

Tools

Export citation

Search in Google Scholar

Reducing the critical thickness of epitaxial Ag film on the Si(111) substrate by introducing a monolayer Al buffer layer

Journal article published in 2007 by Zhe Tang, Jing Teng, Ying Jiang ORCID, JinFeng Jia, Jiandong Guo, Kehui Wu
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

Full text: Unavailable

Green circle
Preprint: archiving allowed
Green circle
Postprint: archiving allowed
Orange circle
Published version: archiving restricted
Data provided by SHERPA/RoMEO