Published in
American Institute of Physics, Journal of Applied Physics, 11(100), p. 113516
DOI: 10.1063/1.2372576
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Depth profile of the biaxial strain in a 10μm thick InN (0001) film
Journal article published in 2006 by
J. Arvanitidis,
D. Christofilos,
G. A. Kourouklis,
A. Delimitis,
M. Katsikini,
P.-H. Komninou 
,
S. Ves,
E. Dimakis,
A. Georgakilas
,
S. Ves,
E. Dimakis,
A. Georgakilas
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
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