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American Institute of Physics, Applied Physics Letters, 13(89), p. 132904

DOI: 10.1063/1.2357341

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Atomic rearrangements in HfO[sub 2]∕Si[sub 1−x]Ge[sub x] interfaces

Journal article published in 2006 by Deok-Yong Cho, S.-J. Oh, Tae Joo Park, Cheol Seong Hwang
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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