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American Institute of Physics, Review of Scientific Instruments, 3(77), p. 03A904

DOI: 10.1063/1.2164968

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Dresden electron beam ion trap: Status report and next developments

Journal article published in 2006 by G. Zschomack, R. Heller, M. Kreller ORCID, S. Landgraf, F. Grossmann, U. Kentsch, V. P. Ovsyannikov, M. Schmidt, F. Ullmann
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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Abstract

The Dresden EBIT is a room-temperature EBIT producing highly charged ions for x-ray spectroscopy as well as for materials modifications and other applications. In the past we have demonstrated the production of ions such as Ar18+, Fe26+, Kr35+, Xe46+, and Ir67+. Here we give a report on the further development of this ion source to increase the electric trap capacity involving the production of a greater amount of highly charged ions.