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American Institute of Physics, Review of Scientific Instruments, 12(76), p. 123703

DOI: 10.1063/1.2140339

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Electron-beam tip/sample heating device for a scanning tunneling microscopy

Journal article published in 2005 by H. F. Ding, J. E. Pearson ORCID, Dongqi Li, Ruihua Cheng, F. Y. Fradin, S. D. Bader
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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Abstract

We present an electron-beam heating device for a scanning tunneling microscopy (STM) that can be used for heating both the STM tip and the sample to 2200K. Mounted on a linear bellows with electrical feedthroughs, the device can be readily installed into the transfer path of a vacuum load lock. We demonstrate the heating capability of the device by flash cleaning Ru(0001) and Fe(001) crystals, and W tips. The flash-cleaned W tips are coated with Fe and further used for spin-polarized imaging of the Mn∕Fe(001) system.