Published in
American Institute of Physics, Applied Physics Letters, 17(87), p. 173108
DOI: 10.1063/1.2115070
Links
Tools
Imaging suspended carbon nanotubes in field-effect transistors configured with microfabricated slits for transmission electron microscopy
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
Data provided by 