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American Institute of Physics, Applied Physics Letters, 11(86), p. 119902

DOI: 10.1063/1.1882745

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Erratum: “X-ray wavefront analysis and optics characterization with a grating interferometer” [Appl. Phys. Lett. 86, 054101 (2005)]

Journal article published in 2005 by Timm Weitkamp, Bernd Nöhammer, Ana Diaz ORCID, Christian David, Eric Ziegler
This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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