Published in
American Institute of Physics, Review of Scientific Instruments, 2(76), p. 023708, 2005
DOI: 10.1063/1.1850652
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- American Institute of Physics
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Tools
Atomic force microscopy-based experimental setup for studying domain switching dynamics in ferroelectric capacitors
Journal article published in 2005 by
C. Dehoff,
B. J. Rodriguez 
,
A. I. Kingon,
R. J. Nemanich,
A. Gruverman,
J. S. Cross
,
A. I. Kingon,
R. J. Nemanich,
A. Gruverman,
J. S. Cross
This paper is available in a repository.
Full text: Download
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