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American Institute of Physics, Applied Physics Letters, 20(85), p. 4702

DOI: 10.1063/1.1812573

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Dielectric properties of epitaxial Ba0.6Sr0.4TiO3 films on SiO2∕Si using biaxially oriented ion-beam-assisted-deposited MgO as templates

This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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