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American Institute of Physics, Journal of Applied Physics, 1(90), p. 248-251, 2001

DOI: 10.1063/1.1379350

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Microoptical characterization of electroluminescent SrS:Cu,Ag thin films by photo- and cathodoluminescence observations

Journal article published in 2001 by D. Poelman ORCID, D. Wauters, J. Versluys, R. L. Van Meirhaeghe
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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