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American Institute of Physics, Applied Physics Letters, 3(72), p. 341

DOI: 10.1063/1.120730

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Factors affecting resolution in scanning electron beam induced patterning of surface adsorption layers

Journal article published in 1998 by Frank Y. C. Hui, Gyula Eres ORCID, David C. Joy
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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