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Published in

American Institute of Physics, Review of Scientific Instruments, 9(70), p. 3609

DOI: 10.1063/1.1149967

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Tip-sample interaction in a “shear-force” near-field scanning optical microscope

Journal article published in 1999 by Kate Hsu, Levi A. Gheber ORCID
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

Full text: Unavailable

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Postprint: archiving allowed
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Data provided by SHERPA/RoMEO

Abstract

The interaction between the tip of a near-field scanning optical microscope (NSOM) and the sample it scans is analyzed and compared to a simple tapping model. The approach curves acquired with the NSOM are in excellent agreement with the model, and additional experiments strongly point against a noncontact interaction (such as shear force). Based on this model we are also able to explain the oscillations pattern of the feedback loop. We conclude that our straight-fiber tip, operating under “shear-force” control, intermittently contacts the surface it is scanning, in a way similar to the tapping mode in atomic force microscope.