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American Chemical Society, Analytical Chemistry, 2(86), p. 1083-1090, 2013

DOI: 10.1021/ac4026576

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Atomic Force Microscope Controlled Topographical Imaging and Proximal Probe Thermal Desorption/Ionization Mass Spectrometry Imaging

Journal article published in 2013 by Olga S. Ovchinnikova, Kevin Kjoller, Gregory B. Hurst ORCID, Dale A. Pelletier, Gary J. Van Berkel
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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