Published in
Cambridge University Press, Microscopy Today, 3(22), p. 42-49, 2014
DOI: 10.1017/s1551929514000509
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Aberration-Corrected S/TEM at Florida State University
Journal article published in 2014 by
Yan Xin,
Ke Han,
Zhiyong Liang,
Yi-Feng Su,
Peter J. Lee 
,
David C. Larbalestier
,
David C. Larbalestier
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