Published in
Cambridge University Press, Microscopy and Microanalysis, S3(20), p. 376-377, 2014
DOI: 10.1017/s1431927614003602
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Atomically Resolved Scanning Confocal Electron Microscopy Using a Double Aberration-corrected Transmission Electron Microscope
Journal article published in 2014 by
Peng Wang,
Angus I. Kirkland,
Peter D. Nellist,
Adrian J. D’Alfonso,
Andrew J. Morgan 
,
Leslie J. Allen,
Ayako Hashimoto,
Masaki Takeguchi,
Kazutaka Mitsuishi,
Masayuki Shimojo
,
Leslie J. Allen,
Ayako Hashimoto,
Masaki Takeguchi,
Kazutaka Mitsuishi,
Masayuki Shimojo
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