Published in
Springer (part of Springer Nature), Journal of Electronic Materials, 8(36), p. 958-962
DOI: 10.1007/s11664-007-0146-0
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Improved Defect and Fourier Transform Infrared Spectroscopy Analysis for Prediction of Yield for HgCdTe Multilayer Heterostructures
Journal article published in 2007 by
D. D. Lofgreen,
M. F. Vilela,
E. P. Smith,
M. D. Newton,
D. Beard,
S. M. Johnson
This paper was not found in any repository, but could be made available legally by the author.
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