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EPL Association, European Physical Society Letters, 6(65), p. 753-759

DOI: 10.1209/epl/i2003-10132-1

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Self-organized criticality in the Bean state in YBa 2 Cu 3 O 7 − x thin films

Journal article published in 2004 by C. M. Aegerter ORCID, M. S. Welling, R. J. Wijngaarden
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This paper is available in a repository.

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Abstract

– The penetration of magnetic flux into a thin film of YBa2Cu3O7−x is studied when the external field is ramped slowly. In this case, the flux penetrates in bursts or avalanches. The size of these avalanches is distributed according to a power law with an exponent of τ =1 .29(2). The additional observation of finite-size scaling of the avalanche distributions, with an avalanche dimension D =1 .89(3), gives strong indications towards self-organized criticality in this system. Furthermore, we determine exponents governing the roughening dynamics of the flux surface using some universal scaling relations. These exponents are compared,to those obtained from a standard roughening analysis. The critical state in a type-II superconductor shows a powerful analogy to a granular pile,