Published in
Springer (part of Springer Nature), Journal of Computational Electronics, 4(10), p. 341-351
DOI: 10.1007/s10825-011-0369-4
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Analyzing the distribution of threshold voltage degradation in nanoscale transistors by using reaction-diffusion and percolation theory
Journal article published in 2011 by
Ahmad Ehteshamul Islam 
,
Muhammad Ashraful Alam
,
Muhammad Ashraful Alam
This paper was not found in any repository, but could be made available legally by the author.
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