Published in
Elsevier, Thin Solid Films, 21(519), p. 7341-7346
DOI: 10.1016/j.tsf.2010.12.227
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Nanometer-scale electronic and microstructural properties of grain boundaries in Cu(In,Ga)Se2
Journal article published in 2011 by
S. Sadewasser,
D. Abou-Ras,
D. Azulay,
R. Baier,
I. Balberg,
D. Cahen,
S. Cohen 
,
K. Gartsman,
K. Ganesan,
J. Kavalakkatt,
W. Li,
O. Millo,
T.-H. Rissom ,
Y. Rosenwaks,
H.-W. Schock
and other authors.
,
K. Gartsman,
K. Ganesan,
J. Kavalakkatt,
W. Li,
O. Millo,
T.-H. Rissom ,
Y. Rosenwaks,
H.-W. Schock
and other authors.
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
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archiving forbidden
Published version:
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