Published in

American Institute of Physics, Review of Scientific Instruments, 4(84), p. 046101

DOI: 10.1063/1.4801460

Links

Tools

Export citation

Search in Google Scholar

Note: Submicrometer-precision sample holder for accurate re-positioning of samples in scanning force microscopy

Journal article published in 2013 by José Abad, Juan Francisco González Martínez, Jaime Colchero ORCID
This paper is available in a repository.
This paper is available in a repository.

Full text: Download

Green circle
Preprint: archiving allowed
Upload
Green circle
Postprint: archiving allowed
Upload
Orange circle
Published version: archiving restricted
Upload
Policy details
Data provided by SHERPA/RoMEO