Published in
American Institute of Physics, Review of Scientific Instruments, 12(85), p. 123702
DOI: 10.1063/1.4902934
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A versatile LabVIEW and field-programmable gate array-based scanning probe microscope for in operando electronic device characterization
Journal article published in 2014 by
Andrew J. Berger,
Michael R. Page 
,
Jan Jacob,
Justin R. Young,
Jim Lewis,
Lothar Wenzel,
Vidya P. Bhallamudi,
Ezekiel Johnston-Halperin,
Denis V. Pelekhov,
P. Chris Hammel
,
Jan Jacob,
Justin R. Young,
Jim Lewis,
Lothar Wenzel,
Vidya P. Bhallamudi,
Ezekiel Johnston-Halperin,
Denis V. Pelekhov,
P. Chris Hammel
This paper is available in a repository.
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