The local structure around the Tl atoms in TlInSe thermoelectric material was investigated by X-ray fluorescence holography (XFH), XAFS, and X-ray diffraction (XD). The temperature dependent XAFS and XD data reveal that no distinct phase change features are found, and the position of the Tl atoms are fluctuated randomly in the Tl chain direction of the crystal, which is consistent with the XFH result at room temperature. Also, an interference between the positions of Tl and In atoms is suggested by all of these experiments.