Published in
American Institute of Physics, Journal of Applied Physics, 20(115), p. 203709
DOI: 10.1063/1.4878979
Links
Tools
Charge noise analysis of metal oxide semiconductor dual-gate Si/SiGe quantum point contacts
Journal article published in 2014 by
J. Kamioka,
T. Kodera 
,
K. Takeda,
T. Obata,
S. Tarucha,
S. Oda
,
K. Takeda,
T. Obata,
S. Tarucha,
S. Oda
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
Data provided by 