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IOP Publishing, IOP Conference Series: Materials Science and Engineering, (16), p. 012004, 2010

DOI: 10.1088/1757-899x/16/1/012004

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Space charge limited current (SCLC) as observed on diamond surface damaged by MeV ion implantation

This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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