Published in
American Institute of Physics, Applied Physics Letters, 6(108), p. 061604, 2016
DOI: 10.1063/1.4941817
Links
Tools
Characterization of atomic force microscopy written conducting nanowires at LaAlO3/SrTiO3 interfaces
Journal article published in 2016 by
M. Boselli,
D. Li,
W. Liu,
A. Fête,
S. Gariglio 
,
J.-M. Triscone
,
J.-M. Triscone
This paper is available in a repository.
Full text: Download
Data provided by 