Trans Tech Publications, Materials Science Forum, (652), p. 139-142, 2010
DOI: 10.4028/www.scientific.net/msf.652.139
Full text: Unavailable
Uniaxial deformed fcc metal samples have been studied by diffraction peak profile analysis. A method that can explain changes in broadening of different peaks by use of a Taylor model has been investigated. It was found that the method qualitatively describes the changes in broadening in nickel and stainless steel samples. It is argued that the differences between predictions and measurements are a feature of how the different samples deform at the microstructural scale.