Published in
Trans Tech Publications, Materials Science Forum, (143-147), p. 183-188
DOI: 10.4028/www.scientific.net/msf.143-147.183
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On the Sensitivity of Optical Reflectivity Spectra to the Bulk Defects in Semiconductors - Example of Crystalline Si
Journal article published in 1993 by
Ryszard Iwanowski,
B. J. Kowalski 
,
B. A. Orłowski,
Jadwiga Bak-Misiuk
,
B. A. Orłowski,
Jadwiga Bak-Misiuk
This paper is made freely available by the publisher.
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