Perovskite solar cells (PSCs) are evolving with an impressive pace, emerging as the most promising next-generation photovoltaic devices. Nevertheless, beside these enormous progresses, the stability of PSCs remains one of the major problems to be challenged, because the most commonly used hole transporting material (HTM), the 2,2′,7,7′-Tetrakis-(N,N-di-4-methoxyphenylamino)−9,9′-spirobifluorene (Spiro-OMeTAD), suffers long-term stability. Here, we tackle this long-lasting issue exploiting reduced graphene oxide (RGO), prepared by an easy and efficient reduction method, as HTM in PSCs. We carried out endurance tests over 1987 h of shelf life and 120 h of light soaking. The PSCs based on RGO have shown power conversion efficiency (PCE) of 6.6%, outperforming the ones achieved with the Spiro-OMeTAD (PCE=6.5%), after the shelf life test. The light soaking test confirmed the better durability of RGO-based PSCs with respect to the Spiro-OMeTAD ones, the latter showing a reduction in PCE 2.7 times higher than the RGO-based cells. Moreover, we demonstrate by Open Circuit Voltage Decay measurements that RGO, beside the HTM function, acts as an anti-recombination layer, reducing the charge carriers recombination pathways and, hence, increasing their lifetime.