Using a multidiagnostic approach the rate Rev [ molec cm -3 s -1 ] or flux J ev [ molec cm -2 s -1 ] of evaporation of H 2 O and its corresponding rate constant for condensation, k cond [s -1 ], on a 1 µm thick ice film have been studied in the temperature range 190 to 240 K as well as in the presence of small amounts of HCl and HBr that left the vapor pressure of H 2 O on ice unchanged. The resulting Arrhenius expressions for pure ice are J ev = 1.6 · 10 28 ± 1 · exp  (- 10.3 ± 1.2/ RT)  [ molec cm -2 s -1 ] , k cond = 1.7 · 10 - 2 ± 1 · exp  (+ 1.6 ± 1.5/ RT ) [s -1 ], in the presence of a HCl mole fraction in the range 3.2 · 10 - 5 - 6.4 · 10 - 3 : J ev = 6.4 · 10 26 ± 1 · exp  (- 9.7 ± 1.2/ RT)  [ molec cm -2 s -1 ] , k cond = 2.8 · 10 - 2 ± 1 · exp ( + 1.5 ± 1.6 /RT)  [s -1 ], and a HBr mole fraction smaller than 6.4 · 10 - 3 : J ev = 7.4 · 10 25 ± 1 · exp ( - 9.1 ± 1.2 /RT)  [ molec cm -2 s -1 ] , k cond = 7.1 · 10 - 5 ± 1 · exp (+ 2.6 ± 1.5/ RT) [s -1 ]. The small negative activation energy for H 2 O condensation on ice points to a precursor mechanism. The corresponding enthalpy of sublimation is D H subl = E ev - E cond = 11.9 ± 2.7 kcal mol -1 , D H subl = 11.2 ± 2.8 kcal mol -1 , and D H subl = 11.7 ± 2.8 kcal mol -1 whose values are identical within experimental uncertainty to the accepted literature value of 12.3 kcal mol -1 . Interferometric data at 633 nm and FTIR absorption spectra in transmission support the kinetic results. The data are consistent with a significant lifetime enhancement for HCl- and HBr-contaminated ice particles by a factor of 3–6 and 10–20, respectively, for submonolayer coverages of HX once the fraction of the ice not contaminated by HX has evaporated.