Published in

American Institute of Physics, Journal of Applied Physics, 5(119), p. 055902

DOI: 10.1063/1.4941268

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Infrared study of α–SiO2 single crystal under high pressure

Journal article published in 2016 by J. Pellicer Porres, A. Segura ORCID, D. Santamaría Pérez
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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Data provided by SHERPA/RoMEO

Abstract

We have measured high pressureα-quartz reflectance spectra in the mid infrared. We used single crystals, taking full profit of polarization. The quality of the spectra allows fitting the reflectance spectra. We have characterized the pressure evolution of E and A2 modes with increased precision, even in the spectral regions where they overlap. In addition, we have determined the TO-LO splitting of each mode. Some of the A2 modes show dramatic pressure variations of the LO-TO splitting, which cannot be explained only by changes in length and ionicity of individual bonds, requiring a new mechanism. We suggest that rotation of the SiO4 tetrahedra plays a fundamental role. We have also determined the evolution of the electronic dielectric constant under high pressure. We find that its pressure increment is mainly a volume effect, although the small increase in birefringence points to secondary changes associated to the electronic resonances.