Published in
American Institute of Physics, Applied Physics Letters, 4(108), p. 042107, 2016
DOI: 10.1063/1.4941027
Links
Tools
Spatial identification of traps in AlGaN/GaN heterostructures by the combination of lateral and vertical electrical stress measurements
Journal article published in 2016 by
Anqi Hu,
Xuelin Yang 
,
Jianpeng Cheng,
Lei Guo,
Jie Zhang,
Weikun Ge,
Maojun Wang,
Fujun Xu,
Ning Tang,
Zhixin Qin,
Xinqiang Wang,
Bo Shen
,
Jianpeng Cheng,
Lei Guo,
Jie Zhang,
Weikun Ge,
Maojun Wang,
Fujun Xu,
Ning Tang,
Zhixin Qin,
Xinqiang Wang,
Bo Shen
This paper is available in a repository.
Full text: Download
Data provided by 