Published in
Springer Verlag, Hyperfine Interactions, 1-3(188), p. 85-89
DOI: 10.1007/s10751-008-9893-4
ICAME 2007, p. 1319-1323
DOI: 10.1007/978-3-540-78697-9_182
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Isothermal defect annealing in semiconductors investigated by time-delayed Mössbauer spectroscopy: Application to ZnO
Journal article published in 2008 by
Haraldur Pall Gunnlaugsson 
,
Gerd Weyer,
R. Mantovan ,
D. Naidoo,
R. Sielemann,
K. Bharuth Ram,
M. Fanciulli,
K. Johnston ,
S. Olafsson,
Guido Langouche
,
Gerd Weyer,
R. Mantovan ,
D. Naidoo,
R. Sielemann,
K. Bharuth Ram,
M. Fanciulli,
K. Johnston ,
S. Olafsson,
Guido Langouche
This paper is available in a repository.
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