Nickel oxide interlayer films from nickel formate–ethylenediamine precursor influence of annealing on thin film properties and photovoltaic device performance Steirer 2015
Dataset published in 2016 by
K. Xerxes Steirer,
Robin E. Richards,
Ajaya K. Sigdel,
Andrés Garcia,
Paul F. Ndione,
Scott Ryan Hammond,
Darick J. Baker,
Erin L. Ratcliff,
Calvin Curtis,
Thomas E. Furtak,
David S. Ginley,
Dana C. Olson,
Neal R. Armstrong,
Joseph J. Berry
