Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Electron Devices, 7(42), p. 1269-1276, 1995
DOI: 10.1109/16.391209
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Effects of high field injection on the hot carrier induced degradation of submicrometer pMOSFET's
Journal article published in 1995 by
Jf F. Zhang 
,
W. Eccleston
,
W. Eccleston
This paper was not found in any repository, but could be made available legally by the author.
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