Abstract The temperature-dependent evolution of the glass into a crystalline phase is studied for a rubidium borosilicate glass of composition 16.7 Rb₂O · 16.7 B₂O₃ · 66.6 SiO₂ employing X-ray diffraction (XRD) data. A glass sample was prepared by melt quenching from 1500°С within 0.5 hour. The glass sample was step-wise annealed at 13 distinct temperatures from 300 °C up to 900 °C for 1 h at every annealing step. To investigate changes in the glass structure, angle-dispersive XRD was applied by using an energy-resolving semiconductor detector. The radial distribution functions (RDFs) were calculated at every stage. For polycrystalline states the crystal structure of the samples with different thermal history was refined using the Rietveld method. Comparing correlation distances estimated from RDFs of glass and polycrystalline samples and mean interatomic distances calculated for polycrystalline samples by using atomic coordinates after Rietveld refinement, it is concluded that the borosilicate glass under study is converted into the crystalline state in the temperature range of 625–750 °C (i.e. in the temperature range close to the glass transition range 620–695 °C as determined by differential scanning calorimetry by using of heating rate of 20 K/min) at an average heating rate of about 0.35 K/min. When the heating rate is increased up to 10 or 20 K/min, the crystallisation temperature shifts sharply up to 831–900 °C and 878–951 °C, respectively. XRD data give evidence that distinctive traces of cubic RbBSi₂O₆ appear from glass at about 625 °C and a two-phase range exists up to 750 °C. After annealing at higher temperatures (800–900 °C) the crystal structure practically does not change any more.