Published in

Institute of Electrical and Electronics Engineers, IEEE Transactions on Magnetics, 1(51), p. 1-4, 2015

DOI: 10.1109/tmag.2014.2357808

Links

Tools

Export citation

Search in Google Scholar

Toward Wafer Scale Inductive Characterization of Spin-Transfer Torque Critical Current Density of Magnetic Tunnel Junction Stacks

Journal article published in 2015 by Sibylle Sievers, Niklas Liebing, Santiago Serrano-Guisan, Ricardo Ferreira, Elvira Paz ORCID, Ambra Caprile ORCID, Alessandra Manzin, Massimo Pasquale, Witold Skowroński, Tomasz Stobiecki, Karsten Rott, Günter Reiss, Jürgen Langer, Berthold Ocker, Hans Werner Schumacher
This paper is available in a repository.
This paper is available in a repository.

Full text: Download

Green circle
Preprint: archiving allowed
Upload
Green circle
Postprint: archiving allowed
Upload
Red circle
Published version: archiving forbidden
Policy details
Data provided by SHERPA/RoMEO

Abstract

We explore the prospects of wafer-scale inductive probing of the critical current density j(c0) for spin-transfer torque (STT) switching of CoFeB/MgO/CoFeB magnetic tunnel junctions with varying MgO thickness. From inductive measurements, magnetostatic parameters and effective damping are derived and j(c0) is calculated based on STT equations. The inductive values compare well with the values derived from current-induced switching measurements on individual nanopillars. Using a wafer-scale inductive probe head could enable wafer probe station-based metrology of j(c0) in the future.