Elsevier, Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1(662), p. 61-70
DOI: 10.1016/j.nima.2011.09.031
Full text: Download
a b s t r a c t Correction procedures for obtaining accurate X-ray structure factors from large area detectors are considered, including subpanel effects, over excited pixels and careful intensity corrections. Problems associated with data normalization, the use of a pixel response correction from a glass standard and minimization of systematic errors are also discussed. Data from glassy GeSe 2 and liquid water measured with a Perkin Elmer amorphous-Silicon detector are used to demonstrate the effectiveness of these correction procedures. This requires reduction of systematic errors in the measured intensity to around the 0.1% level. Published by Elsevier B.V.