Instytut Podstaw Informatyki, Acta Physica Polonica A, 6A(120), p. A-17-A-21, 2011
DOI: 10.12693/aphyspola.120.a-17
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The ZnO-based Schottky diodes revealing a high rectication ratio may be used in many electronic devices. This paper demonstrates several approaches to obtain a ZnO-based Schottky junction with a high rectication ratio. The authors tested several methods such as: post-growth annealing of the ZnO layer, acceptor (nitrogen) doping, as well as the ZnO surface coating with a properly chosen dielectric material. The inuence of these approaches on the diode's rectication ratio together with modeling based on the dierential approach and thermionic emission theory are presented.