Published in
American Physical Society, Physical review B, 7(88)
DOI: 10.1103/physrevb.88.075121
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Thickness-dependent bulk electronic properties in Bi2Se3thin films revealed by infrared spectroscopy
Journal article published in 2013 by
K. W. Post,
B. C. Chapler,
Liang He,
Xufeng Kou 
,
Kang L. Wang,
D. N. Basov
,
Kang L. Wang,
D. N. Basov
This paper was not found in any repository, but could be made available legally by the author.
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