Published in
American Physical Society, Physical review B, 7(81)
DOI: 10.1103/physrevb.81.075217
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Ab initiocalculations and ellipsometry measurements of the optical properties of the layered semiconductorIn4Se3
Journal article published in 2010 by
L. Makinistian,
E. A. Albanesi,
N. V. Gonzalez Lemus,
A. G. Petukhov,
D. Schmidt,
E. Schubert,
M. Schubert 
,
Y.-A. B. Losovyj,
P. Galiy,
P. Dowben
,
Y.-A. B. Losovyj,
P. Galiy,
P. Dowben
This paper is available in a repository.
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