Published in
American Physical Society, Physical review B, 23(84)
DOI: 10.1103/physrevb.84.233301
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Determination of the Poisson ratio of (001) and (111) oriented thin films ofIn2O3by synchrotron-based x-ray diffraction
Journal article published in 2011 by
K. H. L. Zhang,
A. Regoutz 
,
R. G. Palgrave ,
D. J. Payne,
R. G. Egdell,
A. Walsh,
S. P. Collins,
D. Wermeille,
R. A. Cowley
,
R. G. Palgrave ,
D. J. Payne,
R. G. Egdell,
A. Walsh,
S. P. Collins,
D. Wermeille,
R. A. Cowley
This paper is available in a repository.
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Abstract
The Poisson ratio ν of In2O3 has been determined by measurement of the covariation of in-plane and out-of-plane lattice parameters of strained thin films grown epitaxially on (111) and (001) oriented cubic Y-stabilized ZrO2 substrates. The experimental results are in good agreement with values for ν calculated using atomistic simulation procedures.