Published in
IOP Publishing, Semiconductor Science and Technology, 8(30), p. 085014
DOI: 10.1088/0268-1242/30/8/085014
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Electroreflectance characterization of AlInGaN/GaN high-electron mobility heterostructures
Journal article published in 2015 by
P. Yu Bokov,
T. Brazzini,
M. F. Romero,
F. Calle 
,
M. Feneberg,
R. Goldhahn
,
M. Feneberg,
R. Goldhahn
This paper is available in a repository.
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